A wear-leveling algorithm exploiting k-bitwise operations for flash storage devices

被引:3
|
作者
Department of Computer Science and Engineering, Hanyang University, Korea, Republic of [1 ]
机构
[1] Department of Computer Science and Engineering, Hanyang University
来源
IEEE Trans Consum Electron | / 4卷 / 470-477期
关键词
Flash Storage Device; Flash Translation Layer; NAND Flash Memory; Wear-leveling;
D O I
10.1109/TCE.2015.7389801
中图分类号
学科分类号
摘要
Flash storage devices are widely used for mobile consumer electronics due to small size, low power consumption, and high performance. Generally, the flash storage device consists of NAND flash memories. Compared to traditional magnetic disks, NAND flash memory requires an additional erase operation and its blocks have limited erase cycles. For extending its endurance, various wearleveling algorithms have been proposed. However, they invoke many read/write/erase operations and use many memory resources for managing their block states because they do not consider the property of the flash translation layer. To solve these problems, a new wear-leveling algorithm for the log-based flash translation layer is proposed in this paper. In the log-based flash translation layer, since log blocks are frequently updated and erased, the cold block rarely removed is reserved for a next log block so that all the blocks are evenly erased. In addition, the proposed algorithm reduces the usage of memory resources by exploiting k-bitwise erase table that only needs small k-bit erase flags for managing its block erase state. Through various experiments with related wear-leveling algorithms, this paper shows the superiority of the proposed wear-leveling algorithm. © 2015 IEEE.
引用
收藏
页码:470 / 477
页数:7
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