Research on texture and mechanical performance of high-purity CVD tungsten

被引：0

作者：

Sun, Hongchan ^{[1
,2
]}

Li, Shukui ^{[1
]}

Yu, Xiaodong ^{[1
]}

Tan, Chengwen ^{[1
]}

Wang, Fuchi ^{[1
]}

机构：

[1] Beijing Institute of Technology, Beijing 100081, China

[2] Hebei Polytechnic University, Tangshan 063009, China

来源：

Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering | 2010年 / 39卷 / 08期

关键词：

Scanning electron microscopy - Machinery - Microstructure - Tungsten - Dynamics - X ray diffraction - Strain rate;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The microstructure and grain orientation of the high-purity tungsten prepared by a CVD method (CVD-W) were analyzed by optical microscope (OM), X-ray diffraction (XRD) and electron backscatter ring diffraction (EBSD) in a scanning electron microscopy (SEM). The dynamic and static mechanical performances were tested by Hopkinson split-bar and electron testing machinery. Results show that the CVD-W is of columnar-grain microstructure and has (100) texture. The dynamic yield strength of the CVD-W is above 2000 MPa, and the static yield strength is about 1350 MPa. CVD-W has strain-rate sensitivity.

引用

页码：1415 / 1418