Design and implementation of Ka-band AlGaN/GaN HEMTs

被引:0
|
作者
Wang D.-F. [1 ,2 ]
Yuan T.-T. [1 ,2 ]
Wei K. [1 ]
Liu X.-Y. [1 ]
Liu G.-G. [1 ]
机构
[1] Institute of Microelectronics, Chinese Acad. of Sci.
[2] Graduated University of Chinese Acad. of Sci.
关键词
GaN/AlGaN HEMT; Ka band; Millimeter-wave;
D O I
10.3724/sp.j.1010.2011.00255
中图分类号
学科分类号
摘要
In order to improve frequency characteristics, AlGaN/GaN HEMTs were designed by reducing source-drain spacing, optimizing gate-structure and peripheral structure. The devices have been fabricated with domestic GaN epitaxial wafer and process. Measurements indicated that the AlGaN/GaN HEMTs can operate at Ka-band. At VDS=30 V, the HEMTs with 2×75 μm gate-width exhibited a current gain cutoff frequency (fT) of 32 GHz and a maximum frequency of oscillation (fmax) of 150 GHz; Under CW operating condition at 30 GHz, the linear gain reaches 10.2dB. For the HEMTs with 6×75 μm gate-width, fT is 32 GHz and fmax is 92GHz; Under CW operating condition at 30 GHz, the linear gain reaches 8.5 dB. The breakdown voltage is over 60 V.
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页码:255 / 259
页数:4
相关论文
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