Measurement of monochromator's angle repeatability by phase plate diffraction collimation method

被引：0

作者：

Gong, Zhihua ^{[1
]}

Chen, Min ^{[1
]}

Wang, Yong ^{[1
]}

Yan, Rui ^{[1
]}

Tai, Renzhong ^{[1
]}

机构：

[1] Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences

来源：

Guangxue Xuebao/Acta Optica Sinica | 2009年 / 29卷 / 10期

关键词：

Diffraction collimation; Measurement; Phase plate; Plane-grating-monochromator;

D O I：

10.3788/AOS20092910.2813

中图分类号：

学科分类号：

摘要：

In order to measure the mechanical angle repeatability of the variable-included-angle plane-grating-monochromator used in soft X-ray spectro-microscopy beamline at Shanghai Synchrotron Radiation Facility, a new method was proposed based on the phase plate diffraction collimation. This system was designed combining laser diode fiber with phase plate diffraction collimation technique. A 2-dimension CCD was adopted to collect the images, which was used to measure the displacement of the light spot, thus the angle repeatability of the plane mirror and the grating could be determined. The results show that this method could be used to measure the monochromator's angle repeatability in a higher precision estimated to be ± 0.1″, which is better than that measured by the commercial ELCOMAT 3000 auto collimator used in the same condition.

引用

页码：2813 / 2817

页数：4

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