Crystallization control of fullerene by mist vapor deposition method and its application to n-type organic transistors

被引:0
作者
Katori S. [1 ]
Kobashi K. [1 ]
机构
[1] National Institute of Technology, Tsuyama College, Numa, Tsuyama
关键词
Fullerene; Mist vapor deposition method; N-type OFET;
D O I
10.2472/jsms.70.745
中图分类号
学科分类号
摘要
We discussed on crystallization and crystal length control of fullerene(C60) by mist vapor deposition method and fabrication of n-type organic transistor. It was revealed that these crystallinities were affected by the substrate temperature and the amount of mist supplied. The n-type organic transistors using fullerene crystal were able to operate in the atmospheric condition. The electron mobility was estimated to be 7.36×10-6 [cm2/Vs]. Furthermore, the transistor characteristics have been improved by applying HMDS treatment and annealing processing. In particular, the HMDS treatment caused crystals to precipitate between the source and drain electrodes. © 2021 The Society of Materials Science, Japan
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页码:745 / 750
页数:5
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