Effect of growth characteristics on fracture strength of free-standing diamond films

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作者：

School of Material Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China ^{[1
]}

机构：

来源：

Cailiao Rechuli Xuebao | 2008年 / 6卷 / 1-4期

关键词：

Diamond films - Fracture - Plasma jets - X ray diffraction - Chemical vapor deposition - Grain boundaries - Scanning electron microscopy;

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摘要：

Free-standing diamond films were synthesized by 100 kW DC arc plasma jet chemical vapor deposition using a CH4/Ar/H2gas mixture. The effect of growth characteristics on fracture strength of the free-standing diamond films was investigated. The deposited films were characterized by scanning electron microscopy, Raman spectroscopy and X-ray diffraction. The fracture strength of diamond films was tested by three point bending method. The results show that the fracture strength decreases with I(111)/I(220)increasing. The pileup of small grains by second nucleation among columnar grain covers grain boundaries and forms joining bridge , and thus the fracture strength of free-standing diamond films is increased, however, non-diamond phase in the free-standing diamond films decreases its fracture strength.

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