Optimal design method for accelerometer step-down-stress accelerated life testing on condition of small sample

被引：0

作者：

Luo, Geng ^{[1
,3
]}

Mu, Xi-Hui ^{[2
]}

Niu, Yue-Ting ^{[2
]}

Du, Feng-Po ^{[2
]}

Chen, Jian-Hua ^{[3
]}

Wang, Yong-Nan ^{[3
]}

机构：

[1] Ordnance Test Center, Huayin

[2] Ordnance Technological Research Institute, Shijiazhuang

[3] Ordnance Engineering College, Shijiazhuang

来源：

Zhongguo Guanxing Jishu Xuebao/Journal of Chinese Inertial Technology | 2015年 / 23卷 / 05期

关键词：

Accelerated life testing; Accelerometer; Optimal design; Small sample; Step-down-stress;

D O I：

10.13695/j.cnki.12-1222/o3.2015.05.024

中图分类号：

学科分类号：

摘要：

An optimal design method is presented for accelerometer step-down-stress accelerated testing on condition of small sample. Firstly, the storage reliability evaluation method combining minimum chi-square estimation, goodness fit of test and the least square method are used to establish lifetime distribution function and acceleration equation for the statistical data of natural storage environmental test. Secondly, the accelerated stress upper bound is determined based on the failure mode analysis mechanism and the failure tree though high-temperature aging testing. Finally, the credibility evaluation is made for the test sample size, and an optimal experiment scheme is carried out based on MEA-BP neural network for Monte-Carlo simulation. The results show that the relative error between the prior parameter value calculated by the optimal scheme and the original values is less than 1.7%, meeting the requirements of the engineering applications. © 2015, Editorial Department of Journal of Chinese Inertial Technology. All right reserved.

引用

页码：696 / 697

页数：1

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