Thermal stability of Mg2Si0.55Sn0.45 for thermoelectric applications

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作者：
Mejri, M. [1 ]
Malard, B. [2 ]
Thimont, Y. [1 ]
Romanjek, K. [3 ]
Ihou Mouko, H. [4 ]
Estournès, C. [1 ]
机构：
[1] CIRIMAT, Université de Toulouse, CNRS, Université Toulouse 3 - Paul Sabatier, 118 Route de Narbonne, Toulouse cedex 9,31062, France
[2] CIRIMAT, Université de Toulouse, CNRS, Toulouse INP, 4 allée Emile Monso, Toulouse cedex 4,31030, France
[3] CEA-LITEN, Université Grenoble Alpes, 17 rue de martyrs, Grenoble,F-38000, France
[4] HotBlock OnBoard, 43 chemin du vieux chêne, Meylan,F-38240, France
来源：
Journal of Alloys and Compounds | 2021年 / 846卷
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