Exotic X-ray back-diffraction: A path toward a soft inelastic X-ray scattering spectrometer

被引：0
|
作者：
机构：
[1] Hönnicke, Marcelo Goncalves
[2] 2,Conley, Raymond
[3] Cusatis, Cesar
[4] Kakuno, Edson Massayuki
[5] Zhou, Juan
[6] Bouet, Nathalie
[7] Marques, Joao Basso
[8] Vicentin, Flavio Cesar
来源：
Hönnicke, Marcelo Goncalves | 1658年 / International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom卷 / 47期
关键词：
X ray diffraction;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [41] Development of Portable X-Ray Diffractometer Equipped with X-Ray Fluorescence Spectrometer and Its Application to Archaeology
    Yamashita, Daisuke
    Ishizaki, Atsushi
    Uda, Masayuki
    BUNSEKI KAGAKU, 2009, 58 (05) : 347 - 355
  • [42] Back-to-Basics tutorial: X-ray diffraction of thin films
    George F. Harrington
    José Santiso
    Journal of Electroceramics, 2021, 47 : 141 - 163
  • [43] Characterization of AlInN/AlN/GaN FET structures using x-ray diffraction, x-ray reflectometry and grazing incidence x-ray fluorescence analysis
    Lesnik, Andreas
    Blaesing, Juergen
    Hennig, Jonas
    Dadgar, Armin
    Krost, Alois
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2014, 47 (35)
  • [44] An ultrathin buried Si layer in GaAs studied by soft X-ray emission spectroscopy and surface X-ray diffraction: theory and experiment
    Nilsson, PO
    Mankefors, S
    Lundgren, E
    JOURNAL OF ALLOYS AND COMPOUNDS, 1999, 286 (1-2) : 31 - 36
  • [45] Synchrotron radiation X-ray topography and X-ray diffraction of homoepitaxial GaN grown on ammonothermal GaN
    Sintonen, Sakari
    Ali, Muhammad
    Suihkonen, Sami
    Kostamo, Pasi
    Svensk, Olli
    Sopanen, Markku
    Lipsanen, Harri
    Paulmann, Carsten
    Tuomi, Turkka O.
    Zajac, Marcin
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 9, NO 7, 2012, 9 (07): : 1630 - 1632
  • [46] Classification of counterfeit coins using multivariate analysis with X-ray diffraction and X-ray fluorescence methods
    Hida, M
    Sato, H
    Sugawara, H
    Mitsui, T
    FORENSIC SCIENCE INTERNATIONAL, 2001, 115 (1-2) : 129 - 134
  • [47] Mossbauer, X-ray near edge and X-ray diffraction studies on Cu-Ni ferrites
    Mishra, Ashutosh
    Ninama, Samrath
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 2015, 53 (06) : 367 - 370
  • [48] Performances for confocal X-ray diffraction technology based on polycapillary slightly focusing X-ray optics
    Liu, Hehe
    Liu, Zhiguo
    Sun, Tianxi
    Peng, Song
    Ma, Yongzhong
    Sun, Weiyuan
    Li, Yude
    Lin, Xiaoyan
    Zhao, Weigang
    Zhao, Guangcui
    Luo, Ping
    Pan, Qiuli
    Ding, Xunliang
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2013, 723 : 1 - 4
  • [49] X-ray rotation-tilt-method - First results of a new X-ray diffraction technique
    Bauch, J
    Ullrich, HJ
    Reiche, D
    CRYSTAL RESEARCH AND TECHNOLOGY, 2000, 35 (04) : 473 - 478
  • [50] Image plate X-ray diffraction and X-ray reflectivity characterization of protective coatings and thin films
    Lee, SL
    Windover, D
    Doxbeck, M
    Nielsen, M
    Kumar, A
    Lu, TM
    THIN SOLID FILMS, 2000, 377 : 447 - 454
12345