Influence of atomic force microscope cantilever tilt and induced torque on force measurements

被引:0
|
作者
Edwards, Scott A. [1 ]
Ducker, William A. [2 ]
Sader, John E. [1 ]
机构
[1] Department of Mathematics and Statistics, University of Melbourne, VIC 3010, Australia
[2] Department of Chemical and Biomolecular Engineering, University of Melbourne, VIC 3010, Australia
来源
Journal of Applied Physics | 2008年 / 103卷 / 06期
关键词
Cantilever beams;
D O I
暂无
中图分类号
学科分类号
摘要
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [41] Torsional spring constant obtained for an atomic force microscope cantilever
    Jeon, S
    Braiman, Y
    Thundat, T
    APPLIED PHYSICS LETTERS, 2004, 84 (10) : 1795 - 1797
  • [42] Monitoring of an atomic force microscope cantilever with a compact disk pickup
    Quercioli, F
    Tiribilli, B
    Ascoli, C
    Baschieri, P
    Frediani, C
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (09): : 3620 - 3624
  • [43] Vibration frequency and sensitivity of an atomic force microscope cantilever with a crack
    Lee, Haw-Long
    Yang, Yu-Ching
    Chang, Win-Jin
    Journal of Computational and Theoretical Nanoscience, 2015, 12 (11) : 4329 - 4334
  • [44] Contact Stiffness Measurements with an Atomic Force Microscope
    Ankudinov, A. V.
    Khalisov, M. M.
    TECHNICAL PHYSICS, 2020, 65 (11) : 1866 - 1872
  • [45] Qualitative adsorption measurements with an atomic force microscope
    Inst for Surface Chemistry, Stockholm, Sweden
    Langmuir, 20 (5676-5679):
  • [46] Mask CD measurements with an atomic force microscope
    Yoshida, Y
    Sasaki, S
    Abe, T
    Mohri, H
    Hayashi, N
    PHOTOMASK AND NEXT GENERATION LITHOGRAPHY MASK TECHNOLOGY XI, 2004, 5446 : 759 - 769
  • [47] Contact Stiffness Measurements with an Atomic Force Microscope
    A. V. Ankudinov
    M. M. Khalisov
    Technical Physics, 2020, 65 : 1866 - 1872
  • [48] Qualitative adsorption measurements with an atomic force microscope
    Larson, I
    Pugh, RJ
    LANGMUIR, 1998, 14 (20) : 5676 - 5679
  • [49] Atomic Force Microscope techniques for adhesion measurements
    Schaefer, DM
    Gomez, J
    JOURNAL OF ADHESION, 2000, 74 (1-4): : 341 - +
  • [50] CHARACTERIZATION OF ATOMIC-FORCE MICROSCOPE TIPS BY ADHESION FORCE MEASUREMENTS
    THUNDAT, T
    ZHENG, XY
    CHEN, GY
    SHARP, SL
    WARMACK, RJ
    SCHOWALTER, LJ
    APPLIED PHYSICS LETTERS, 1993, 63 (15) : 2150 - 2152