Surface and interface studies by neutron reflectivity

被引:0
作者
Sakurai K. [1 ]
Hino M. [2 ]
Takeda M. [3 ]
机构
[1] National Institute for Materials Science, Tsukuba
[2] Research Reactor Institute, Kyoto University, Kumatori
[3] Japan Atomic Energy Agency, Tokai
关键词
All Open Access; Bronze;
D O I
10.3131/jvsj2.53.747
中图分类号
学科分类号
摘要
Neutron reflectivity is a feasible probe for surfaces and interfaces. It can provide information on the density, layer thickness and roughness for multilayered thin films. As it does not always require vacuum, one could study the variety of real surfaces and interfaces under the controlled atmosphere. The technique has some common features to X-ray reflectivity, but at the same time it owns very unique and extremely attractive features, such as high-sensitivity to low Z elements including isotope effects in soft materials and availability for magnetic structure analysis. The present article describes the recent activities of currently accessible neutron reflectometers in Japan.
引用
收藏
页码:747 / 752
页数:5
相关论文
共 19 条
[1]  
J. de Physique, C7, (1989)
[2]  
Springer Proceedings in Physics, 61, (1992)
[3]  
Physica B, 198, (1994)
[4]  
Physica B, 221, 1-4, (1996)
[5]  
Physica B, 248, 1-4, (1998)
[6]  
Physica B, 283, 1-3, (2000)
[7]  
Physica B, 336, 1-2, (2003)
[8]  
Physica B, 357, 1-2, (2005)
[9]  
Thin Solid Films, 515, 14, (2007)
[10]  
Euro. Phys. J. Special Topics, 167, (2009)