Penetration capacity under voltage constraint and evaluation methodology of voltage fluctuation caused by centralized grid connection of photovoltaic power

被引：0

作者：

Wang, Jing ^{[1
]}

Jiang, Xiaoliang ^{[1
]}

Yang, Zhuo ^{[1
]}

Guan, Chaojie ^{[1
]}

Guo, Zhengyi ^{[2
]}

Hu, Po ^{[2
]}

机构：

[1] Henan Electric Power Company Economic Research Institute, Zhengzhou, 450000, Henan Province

[2] School of Electrical Engineering, Wuhan University, Wuhan, 430072, Hubei Province

来源：

Dianwang Jishu/Power System Technology | 2015年 / 39卷 / 09期

关键词：

Evaluation index; Grid connection; Penetration capacity; Photovoltaic; PSCAD; Voltage deviation; Voltage fluctuation;

D O I：

10.13335/j.1000-3673.pst.2015.09.012

中图分类号：

学科分类号：

摘要：

Centralized grid connection of large capacity photovoltaic power undoubtedly causes certain influence on voltage in distribution network, especially at point of common coupling (PCC), and random fluctuation of photovoltaic power output leads random voltage fluctuant in power grid. Therefore, a mathematical model of PCC's voltage deviation under centralized grid connection of large capacity photovoltaic power is constructed and PV penetration capacity under voltage constraint is derived. Four indexes are defined to fully reflect bus voltage fluctuation, namely distribution center, discrete degree, skewness and kurtosis and accordingly a method assessing voltage fluctuation of power system is put forward. Based on stochastic model of photovoltaic output, photovoltaic power station module in accordance with actual situation is established in PSCAD. A single power supplied chain distribution network is taken as an example to verify the accuracy and validity of these proposed indexes with PSCAD simulation. Finally, the proposed indexes and method are applied to evaluate the voltage fluctuation of a regional power grid with photovoltaic power station. The results show that the evaluation indexes and corresponding method can provide instructive reference for PCC selection. ©, 2015, Power System Technology Press. All right reserved.

引用

页码：2450 / 2457

页数：7

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