An investigation into the determinant parameter of car interior low-frequency noise

被引：0
|
作者：
Gao, Shuna [1 ,2 ]
Deng, Zhaoxiang [2 ]
机构：
[1] College of Engineering and Technology, Southwest University, Chongqing 400716, China
[2] The State Key Laboratory of Mechanical Transmission, Chongqing University, Chongqing 400030, China
来源：
Qiche Gongcheng/Automotive Engineering | 2013年 / 35卷 / 08期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：744 / 748
相关论文
共 50 条
  • [1] Investigation of environmental low-frequency noise
    Krylov, VV
    APPLIED ACOUSTICS, 1997, 51 (01) : 33 - 51
  • [2] Analysis of vehicle interior low-frequency noise based on ATV
    Long Ma
    Xia Wenfeng
    CURRENT DEVELOPMENT OF MECHANICAL ENGINEERING AND ENERGY, PTS 1 AND 2, 2014, 494-495 : 78 - +
  • [3] An investigation of low-frequency noise in complementary SiGeHBTs
    Zhao, EH
    Krithivasan, R
    Sutton, AK
    Jin, ZR
    Cressler, JD
    El-Kareh, B
    Balster, S
    Yasuda, H
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2006, 53 (02) : 329 - 338
  • [4] AN INVESTIGATION OF ANOMALOUS LOW-FREQUENCY NOISE OF A MASER
    GUDNOV, VM
    ZOTOV, VV
    NAGONYKH, LM
    SOROCHEN.RL
    SHTEYNSH.VB
    RADIO ENGINEERING AND ELECTRONIC PHYSICS-USSR, 1970, (03): : 545 - &
  • [5] PARAMETER FLUCTUATIONS AND LOW-FREQUENCY NOISE IN JOSEPHSON JUNCTION DEVICES
    TESCHE, CD
    APPLIED PHYSICS LETTERS, 1982, 41 (01) : 99 - 100
  • [6] INVESTIGATION OF LOW-FREQUENCY NOISE OF BIPOLAR-TRANSISTORS
    LUCHININ, AS
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOFIZIKA, 1990, 33 (05): : 624 - 631
  • [7] Investigation of Low-Frequency Noise in Silicon Nanowire MOSFETs
    Zhuge, Jing
    Wang, Runsheng
    Huang, Ru
    Tian, Yu
    Zhang, Liangliang
    Kim, Dong-Won
    Park, Donggun
    Wang, Yangyuan
    IEEE ELECTRON DEVICE LETTERS, 2009, 30 (01) : 57 - 60
  • [8] Nanoscale MOS devices: device parameter fluctuations and low-frequency noise
    Wong, H
    Iwai, H
    Liou, JJ
    NOISE IN DEVICES AND CIRCUITS III, 2005, 5844 : 164 - 176
  • [9] Investigation of Low-Frequency Noise Characteristics in Gated Schottky Diodes
    Kwon, Dongseok
    Shin, Wonjun
    Bae, Jong-Ho
    Lim, Suhwan
    Park, Byung-Gook
    Lee, Jong-Ho
    IEEE ELECTRON DEVICE LETTERS, 2021, 42 (03) : 442 - 445
  • [10] Investigation of Low-frequency Noise in van der Waals Epitaxies
    Wang, S. F.
    Fong, W. K.
    Surya, C.
    2013 22ND INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF), 2013,
12345