Practical aspects of applied optimized survey design for electrical resistivity tomography

被引：0
|
作者：
Wilkinson, Paul B. [1 ]
Loke, Meng Heng [2 ]
Meldrum, Philip I. [1 ]
Chambers, Jonathan E. [1 ]
Kuras, Oliver [1 ]
Gunn, David A. [1 ]
Ogilvy, Richard D. [1 ]
机构：
[1] British Geological Survey, Kingsley Dunham Centre, Keyworth, Nottingham, NG12 5GG, United Kingdom
[2] Geotomo Software, 115 Cangkat Minden Jalan 5, Minden Heights, 11700 Gelugor, Penang, Malaysia
来源：
Geophysical Journal International | 2012年 / 189卷 / 01期
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Inverse problems - Random errors - Electrodes - Simulated annealing - Image resolution - Polarization
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收藏
页码：428 / 440
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