Applications of two-dimensional wavelet transform on phase analysis of spatial carrier-fringe patterns

被引：0
|
作者：
Li S. [1 ]
Su X. [1 ]
Chen W. [1 ]
机构：
[1] Department of Opto-Electronic, Sichuan University, Chengdu
来源：
Guangxue Xuebao/Acta Optica Sinica | 2010年 / 30卷 / 06期
关键词：
Hilbert transform; Optical measurement; Phase analysis; Two dimensional wavelet transform; Wavelet transform profilometry;
D O I：
10.3788/AOS20103006.1673
中图分类号：
学科分类号：
摘要：
Two-dimensional (2D) wavelet transform is applied to phase analysis of spatial carrier-fringe patterns. Hilbert transform is firstly performed on carrier-fringe patterns to get the complex signals, in which the phase information is included. And then two-dimensional wavelet transform is carried out on the signals. Finally, the phase information demodulated by the height of object can be gotten from the wavelet transform coefficients at the wavelet ridge position. The result performs better than that of one-dimensional wavelet transform method, especially when there is much noise in the fringe patterns. Computer simulation and experiments verify the validity of the proposed method.
引用
收藏
页码：1673 / 1679
页数：6
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