Metamorphic Testing for the Validation of Deep-learning-based Object Detection Systems

被引：0

作者：

Trien, Maximilian ^{[1
]}

Kufer, Dominik ^{[1
]}

Speth, Simon ^{[2
]}

机构：

[1] IAV GmbH, München, Germany

[2] Technische Universität München, München, Germany

来源：

ATZ worldwide | 2025年 / 127卷 / 01期

关键词：

D O I：

10.1007/s38311-024-2004-6

中图分类号：

学科分类号：

摘要：

引用

页码：36 / 39

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