Metamorphic Testing for the Validation of Deep-learning-based Object Detection Systems

被引：0
作者：
Trien, Maximilian [1 ]
Kufer, Dominik [1 ]
Speth, Simon [2 ]
机构：
[1] IAV GmbH, München, Germany
[2] Technische Universität München, München, Germany
来源：
ATZ worldwide | 2025年 / 127卷 / 01期
关键词：
D O I：
10.1007/s38311-024-2004-6
中图分类号：
学科分类号：
摘要：
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页码：36 / 39
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