Online non-contact fault detection method of LED chip

被引：0
|
作者：
Li, Lian [1 ]
Li, Ping [1 ]
Wen, Yumei [1 ]
Yin, Fei [1 ]
机构：
[1] Key Laboratory for Opto-Electronic Technology and Systems, College of Opto-Electronic Engineering, Chongqing University, Chongqing 400044, China
来源：
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument | 2008年 / 29卷 / 04期
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摘要：
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页码：760 / 764
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