Single-Beam Atomic Magnetometer Enhanced With Elliptically Polarized Reflected Light

The ultra-sensitivity magnetometer plays an important role in fundamental physics and applications, including magnetoencephalography (MEG) and magnetocardiography (MCG). The spin-exchange relaxation-free (SERF) atomic magnetometer (AM) has great sensitivity but is limited by the relatively complicated dual-beam structure for application, leading to the development of the compact AM based on one single laser beam. Compared with the single-beam optically pumped magnetometer (OPM) detecting the absorption of the circularly polarized beam, the SERF AM based on an elliptically polarized single beam detecting the optical rotation angle of polarization has a better response, lower laser power, and no need for signal modulation or demodulation. Here, we would like to report an elliptically-polarized single-beam SERF AM enhanced by reflecting the probe beam, increasing the light-atom interaction. Moreover, unlike the previous reflecting AM using the beam splitter, we used a D-shape mirror to extract the reflected beam, avoiding power losses of both incident and reflected beam and destruction of polarization. The sensitivity of our device in the reflecting scheme reaches 5 fT/Hz(1/2) at 9-60 Hz, satisfying the need to measure the human MEG/MCG or search for the fifth force. Our research paves the way for developing the compact SERF AM for multiple future applications.