Microwave imaging reflectometry system for KSTAR

被引：0

作者：

Lee, Woochang ^{[1
]}

Yun, Gunsu S. ^{[1
]}

Hong, Inho ^{[1
]}

Kim, Minwoo ^{[1
]}

Kim, Jincheol B. ^{[1
]}

Nam, Yoonbum ^{[1
]}

Park, Hyeon K. ^{[1
]}

Kim, Young G. ^{[2
]}

Kim, Kang W. ^{[2
]}

Tobias, Benjamin ^{[3
]}

Domier, Calvin W. ^{[3
]}

Luhmann Jr., Neville C. ^{[3
]}

机构：

[1] POSTECH, Pohang, Gyeongbuk 790-784, Korea, Republic of

[2] Kyungpook National University, Daegu 702-701, Korea, Republic of

[3] University of California, Davis, CA 95616, United States

来源：

关键词：

D O I：

2402037

中图分类号：

学科分类号：

摘要：

Imaging systems - Reflection - Electron density measurement - Computerized tomography - Reflectometers - Carrier concentration

引用