Optical studies of physically deposited nano-Ag2Te thin films

被引：2

作者：

Pandiaraman M. ^{[1
]}

Soundararajan N. ^{[2
]}

Ganesan R. ^{[3
]}

机构：

[1] Department of Physics, Sethu Institute of Technology, Virudhunagar

[2] Thin Film Laboratory, School of Physics, Madurai Kamaraj University, Madurai

[3] Department of Physics, Indian Institute of Science, Bangalore

来源：

Defect and Diffusion Forum | 2011年 / 319-320卷

关键词：

Band Gap; Emission; Micro-Raman; Optical Studies; Thin Films;

D O I：

10.4028/www.scientific.net/DDF.319-320.185

中图分类号：

学科分类号：

摘要：

Silver telluride (Ag2Te), I-VI semiconductor compound with potential applications in various advanced fields. Ag2Te nano films of thickness between 16 nm and 145 nm prepared by thermal evaporation technique at high vacuum better than 2×105 mbar. These films are found to exhibit polycrystalline nature with monoclinic structure from their XRD studies. The average particle size of these films are found to be around 24 nm using the Debye-Scherrer's formula From AFM measurements, the average particle size is around 24 nm. The emission spectra of these films were recorded and analysed to determine its optical band gap. Optical band gap of Ag2Te varies from 1.6 eV to 1.8 eV with respect to their corresponding thicknesses of films. © (2011) Trans Tech Publications, Switzerland.

引用

页码：185 / 192

页数：7

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