High-performance CMOS variability in the 65-nm regime and beyond

被引：0

作者：

Bernstein, Kerry ^{[1
]}

Frank, David J. ^{[1
]}

Gattiker, Anne E. ^{[2
]}

Haensch, Wilfried ^{[1
]}

Ji, Brian L. ^{[1
]}

Nassif, Sani R. ^{[2
]}

Nowak, Edward J. ^{[3
]}

Pearson, Dale J. ^{[1
]}

Rohrer, Norman J. ^{[3
]}

机构：

[1] IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, United States

[2] IBM Research Division, Austin Research Laboratory, 11501 Burnet Road, Austin, TX 78758, United States

[3] IBM Systems and Technology Group, 1000 River Street, Essex Junction, VT 05452, United States

来源：

IBM Journal of Research and Development | 2006年 / 50卷 / 4-5期

关键词：

45;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Journal article (JA)

引用

页码：433 / 449

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