High-performance CMOS variability in the 65-nm regime and beyond

被引：0
|
作者：
Bernstein, Kerry [1 ]
Frank, David J. [1 ]
Gattiker, Anne E. [2 ]
Haensch, Wilfried [1 ]
Ji, Brian L. [1 ]
Nassif, Sani R. [2 ]
Nowak, Edward J. [3 ]
Pearson, Dale J. [1 ]
Rohrer, Norman J. [3 ]
机构：
[1] IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, United States
[2] IBM Research Division, Austin Research Laboratory, 11501 Burnet Road, Austin, TX 78758, United States
[3] IBM Systems and Technology Group, 1000 River Street, Essex Junction, VT 05452, United States
来源：
IBM Journal of Research and Development | 2006年 / 50卷 / 4-5期
关键词：
45;
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摘要：
Journal article (JA)
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页码：433 / 449
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