Bridging expert knowledge with deep learning techniques for just-in-time defect prediction

被引:0
作者
Zhou, Xin [1 ]
Han, Donggyun [2 ]
Lo, David [1 ]
机构
[1] Singapore Management Univ, Sch Comp & Informat Syst, 80 Stamford Rd, Singapore, Singapore
[2] Univ London, Dept Comp Sci Royal Holloway, Egham TW20 0EX, England
基金
新加坡国家研究基金会;
关键词
Just-in-time defect prediction; Expert knowledge; Deep learning; Multi-modal fusion; FUSION METHODS; BUGS;
D O I
10.1007/s10664-024-10591-0
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Just-In-Time (JIT) defect prediction aims to automatically predict whether a commit is defective or not, and has been widely studied in recent years. In general, most studies can be classified into two categories: 1) simple models using traditional machine learning classifiers with hand-crafted features, and 2) complex models using deep learning techniques to automatically extract features from commit contents. Hand-crafted features used by simple models are based on expert knowledge but may not fully represent the semantic meaning of the commits. On the other hand, deep learning-based features used by complex models represent the semantic meaning of commits but may not reflect useful expert knowledge. Simple models and complex models seem complementary to each other to some extent. To utilize the advantages of both simple and complex models, we propose a model fusion framework that adopts both early fusions on the feature level and late fusions on the decision level. We propose SimCom++ by adopting the best early and late fusion strategies. The experimental results show that SimCom++ can significantly outperform the baselines by 5.7-26.9%. In addition, our experimental results confirm that the simple model and complex model are complementary to each other.
引用
收藏
页数:44
相关论文
共 50 条
[21]   Interpretability application of the Just-in-Time software defect prediction model [J].
Zheng, Wei ;
Shen, Tianren ;
Chen, Xiang ;
Deng, Peiran .
JOURNAL OF SYSTEMS AND SOFTWARE, 2022, 188
[22]   The Impact of Mislabeled Changes by SZZ on Just-in-Time Defect Prediction [J].
Fan, Yuanrui ;
Xia, Xin ;
da Costa, Daniel Alencar ;
Lo, David ;
Hassan, Ahmed E. ;
Li, Shanping .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2021, 47 (08) :1559-1586
[23]   Just-in-time defect prediction based on AST change embedding [J].
Zhuang, Weiyuan ;
Wang, Hao ;
Zhang, Xiaofang .
KNOWLEDGE-BASED SYSTEMS, 2022, 248
[24]   Boosting multi-objective just-in-time software defect prediction by fusing expert metrics and semantic metrics [J].
Chen, Xiang ;
Xia, Hongling ;
Pei, Wenlong ;
Ni, Chao ;
Liu, Ke .
JOURNAL OF SYSTEMS AND SOFTWARE, 2023, 206
[25]   Multi-task deep neural networks for just-in-time software defect prediction on mobile apps [J].
Huang, Qiguo ;
Li, Zhengliang ;
Gu, Qing .
CONCURRENCY AND COMPUTATION-PRACTICE & EXPERIENCE, 2024, 36 (10)
[26]   A Preliminary Evaluation of CPDP Approaches on Just-in-Time Software Defect Prediction [J].
Amasaki, Sousuke ;
Aman, Hirohisa ;
Yokogawa, Tomoyuki .
2021 47TH EUROMICRO CONFERENCE ON SOFTWARE ENGINEERING AND ADVANCED APPLICATIONS (SEAA 2021), 2021, :279-286
[27]   Just-In-Time Defect Prediction on Java']JavaScript Projects: A Replication Study [J].
Ni, Chao ;
Xia, Xin ;
Lo, David ;
Yang, Xiaohu ;
Hassan, Ahmed E. .
ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, 2022, 31 (04)
[28]   Estimating Uncertainty in Labeled Changes by SZZ Tools on Just-In-Time Defect Prediction [J].
Guo, Shikai ;
Li, Dongmin ;
Huang, Lin ;
Lv, Sijia ;
Chen, Rong ;
Li, Hui ;
Li, Xiaochen ;
Jiang, He .
ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, 2024, 33 (04)
[29]   Feature Importance in the Context of Traditional and Just-In-Time Software Defect Prediction Models [J].
Haldar, Susmita ;
Capretz, Luiz Fernando .
2024 IEEE CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, CCECE 2024, 2024, :818-822
[30]   A Formal Explainer for Just-In-Time Defect Predictions [J].
Yu, Jinqiang ;
Fu, Michael ;
Ignatiev, Alexey ;
Tantithamthavorn, Chakkrit ;
Stuckey, Peter .
ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, 2024, 33 (07)