Bridging expert knowledge with deep learning techniques for just-in-time defect prediction

被引:0
作者
Zhou, Xin [1 ]
Han, Donggyun [2 ]
Lo, David [1 ]
机构
[1] Singapore Management Univ, Sch Comp & Informat Syst, 80 Stamford Rd, Singapore, Singapore
[2] Univ London, Dept Comp Sci Royal Holloway, Egham TW20 0EX, England
基金
新加坡国家研究基金会;
关键词
Just-in-time defect prediction; Expert knowledge; Deep learning; Multi-modal fusion; FUSION METHODS; BUGS;
D O I
10.1007/s10664-024-10591-0
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Just-In-Time (JIT) defect prediction aims to automatically predict whether a commit is defective or not, and has been widely studied in recent years. In general, most studies can be classified into two categories: 1) simple models using traditional machine learning classifiers with hand-crafted features, and 2) complex models using deep learning techniques to automatically extract features from commit contents. Hand-crafted features used by simple models are based on expert knowledge but may not fully represent the semantic meaning of the commits. On the other hand, deep learning-based features used by complex models represent the semantic meaning of commits but may not reflect useful expert knowledge. Simple models and complex models seem complementary to each other to some extent. To utilize the advantages of both simple and complex models, we propose a model fusion framework that adopts both early fusions on the feature level and late fusions on the decision level. We propose SimCom++ by adopting the best early and late fusion strategies. The experimental results show that SimCom++ can significantly outperform the baselines by 5.7-26.9%. In addition, our experimental results confirm that the simple model and complex model are complementary to each other.
引用
收藏
页数:44
相关论文
共 50 条
  • [21] The Impact of Mislabeled Changes by SZZ on Just-in-Time Defect Prediction
    Fan, Yuanrui
    Xia, Xin
    da Costa, Daniel Alencar
    Lo, David
    Hassan, Ahmed E.
    Li, Shanping
    IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2021, 47 (08) : 1559 - 1586
  • [22] Interpretability application of the Just-in-Time software defect prediction model
    Zheng, Wei
    Shen, Tianren
    Chen, Xiang
    Deng, Peiran
    JOURNAL OF SYSTEMS AND SOFTWARE, 2022, 188
  • [23] Just-in-time defect prediction based on AST change embedding
    Zhuang, Weiyuan
    Wang, Hao
    Zhang, Xiaofang
    KNOWLEDGE-BASED SYSTEMS, 2022, 248
  • [24] Boosting multi-objective just-in-time software defect prediction by fusing expert metrics and semantic metrics
    Chen, Xiang
    Xia, Hongling
    Pei, Wenlong
    Ni, Chao
    Liu, Ke
    JOURNAL OF SYSTEMS AND SOFTWARE, 2023, 206
  • [25] Multi-task deep neural networks for just-in-time software defect prediction on mobile apps
    Huang, Qiguo
    Li, Zhengliang
    Gu, Qing
    CONCURRENCY AND COMPUTATION-PRACTICE & EXPERIENCE, 2024, 36 (10)
  • [26] Just-In-Time Defect Prediction on Java']JavaScript Projects: A Replication Study
    Ni, Chao
    Xia, Xin
    Lo, David
    Yang, Xiaohu
    Hassan, Ahmed E.
    ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, 2022, 31 (04)
  • [27] A Preliminary Evaluation of CPDP Approaches on Just-in-Time Software Defect Prediction
    Amasaki, Sousuke
    Aman, Hirohisa
    Yokogawa, Tomoyuki
    2021 47TH EUROMICRO CONFERENCE ON SOFTWARE ENGINEERING AND ADVANCED APPLICATIONS (SEAA 2021), 2021, : 279 - 286
  • [28] Estimating Uncertainty in Labeled Changes by SZZ Tools on Just-In-Time Defect Prediction
    Guo, Shikai
    Li, Dongmin
    Huang, Lin
    Lv, Sijia
    Chen, Rong
    Li, Hui
    Li, Xiaochen
    Jiang, He
    ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, 2024, 33 (04)
  • [29] Feature Importance in the Context of Traditional and Just-In-Time Software Defect Prediction Models
    Haldar, Susmita
    Capretz, Luiz Fernando
    2024 IEEE CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, CCECE 2024, 2024, : 818 - 822
  • [30] A Formal Explainer for Just-In-Time Defect Predictions
    Yu, Jinqiang
    Fu, Michael
    Ignatiev, Alexey
    Tantithamthavorn, Chakkrit
    Stuckey, Peter
    ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, 2024, 33 (07)