Bridging expert knowledge with deep learning techniques for just-in-time defect prediction

被引:0
作者
Zhou, Xin [1 ]
Han, Donggyun [2 ]
Lo, David [1 ]
机构
[1] Singapore Management Univ, Sch Comp & Informat Syst, 80 Stamford Rd, Singapore, Singapore
[2] Univ London, Dept Comp Sci Royal Holloway, Egham TW20 0EX, England
基金
新加坡国家研究基金会;
关键词
Just-in-time defect prediction; Expert knowledge; Deep learning; Multi-modal fusion; FUSION METHODS; BUGS;
D O I
10.1007/s10664-024-10591-0
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Just-In-Time (JIT) defect prediction aims to automatically predict whether a commit is defective or not, and has been widely studied in recent years. In general, most studies can be classified into two categories: 1) simple models using traditional machine learning classifiers with hand-crafted features, and 2) complex models using deep learning techniques to automatically extract features from commit contents. Hand-crafted features used by simple models are based on expert knowledge but may not fully represent the semantic meaning of the commits. On the other hand, deep learning-based features used by complex models represent the semantic meaning of commits but may not reflect useful expert knowledge. Simple models and complex models seem complementary to each other to some extent. To utilize the advantages of both simple and complex models, we propose a model fusion framework that adopts both early fusions on the feature level and late fusions on the decision level. We propose SimCom++ by adopting the best early and late fusion strategies. The experimental results show that SimCom++ can significantly outperform the baselines by 5.7-26.9%. In addition, our experimental results confirm that the simple model and complex model are complementary to each other.
引用
收藏
页数:44
相关论文
共 50 条
  • [1] Deep Learning for Just-In-Time Defect Prediction
    Yang, Xinli
    Lo, David
    Xia, Xin
    Zhang, Yun
    Sun, Jianling
    2015 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE SECURITY AND RELIABILITY (QRS 2015), 2015, : 17 - 26
  • [2] Just-in-time defect prediction for mobile applications: using shallow or deep learning?
    Raymon van Dinter
    Cagatay Catal
    Görkem Giray
    Bedir Tekinerdogan
    Software Quality Journal, 2023, 31 : 1281 - 1302
  • [3] Just-in-time defect prediction for mobile applications: using shallow or deep learning?
    van Dinter, Raymon
    Catal, Cagatay
    Giray, Goerkem
    Tekinerdogan, Bedir
    SOFTWARE QUALITY JOURNAL, 2023, 31 (04) : 1281 - 1302
  • [4] Deep Semantic and Strutural Features Learning based on Graph for Just-in-Time Defect Prediction
    M'baya, Abir
    Moalla, Nejib
    ENASE: PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON EVALUATION OF NOVEL APPROACHES TO SOFTWARE ENGINEERING, 2022, : 128 - 137
  • [5] Just-in-Time Software Defect Prediction Techniques: A Survey
    Alnagi, Eman
    Azzeh, Mohammad
    2024 15TH INTERNATIONAL CONFERENCE ON INFORMATION AND COMMUNICATION SYSTEMS, ICICS 2024, 2024,
  • [6] Deep Just-in-Time Defect Prediction: How Far Are We?
    Zeng, Zhengran
    Zhang, Yuqun
    Zhang, Haotian
    Zhang, Lingming
    ISSTA '21: PROCEEDINGS OF THE 30TH ACM SIGSOFT INTERNATIONAL SYMPOSIUM ON SOFTWARE TESTING AND ANALYSIS, 2021, : 427 - 438
  • [8] Deep Just-In-Time Defect Localization
    Qiu, Fangcheng
    Gao, Zhipeng
    Xia, Xin
    Lo, David
    Grundy, John
    Wang, Xinyu
    IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2022, 48 (12) : 5068 - 5086
  • [9] A Replication Study: Just-In-Time Defect Prediction with Ensemble Learning
    Young, Steven
    Abdou, Tamer
    Bener, Ayse
    2018 IEEE/ACM 6TH INTERNATIONAL WORKSHOP ON REALIZING ARTIFICIAL INTELLIGENCE SYNERGIES IN SOFTWARE ENGINEERING (RAISE), 2018, : 42 - 47
  • [10] Just-in-Time Defect Prediction for Self-driving Software via a Deep Learning Model
    Choi, Jiwon
    Kim, Taeyoung
    Ryu, Duksan
    Baik, Jongmoon
    Kim, Suntae
    JOURNAL OF WEB ENGINEERING, 2023, 22 (02): : 303 - 326