Research on high-temperature permittivity and loss tangent of low-loss dielectric by resonant-cavity technique

被引：0
|
作者：
Cao, Maosheng [1 ]
Hou, Zhiling [1 ,2 ]
Shi, Xiaoling [1 ]
Wang, Fuchi [1 ]
机构：
[1] School of Material Science and Engineering, Beijing Institute of Technology, Beijing 100081, China
[2] School of Science, Beijing University of Chemical Technology, Beijing 100029, China
来源：
High Technology Letters | 2007年 / 13卷 / 03期
关键词：
Dielectric materials;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：279 / 282
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