Integrating independent component analysis and support vector machine for identifying process status changes

被引:0
作者
Huang, Kuo-Ko [1 ]
Cheng, Chuen-Sheng [1 ]
机构
[1] Department of Industrial Engineering and Management, Yuan Ze University
来源
Journal of Quality | 2014年 / 21卷 / 06期
关键词
Independent component analysis; Support vector machine; Time series data pattern;
D O I
10.6220/joq.2014.21(6).01
中图分类号
学科分类号
摘要
Time series data pattern recognition is critical for statistical process control. This paper assumes that observations from the in-control process consist of in-control signals and random noise. The in-control signals switch to different signal types when the process status changes. In these cases, process data monitoring can be formulated as a pattern recognition task. This paper proposes a novel approach using independent component analysis (ICA) and support vector machine (SVM) for time series data pattern recognition. The proposed method applies ICA to the measurement data to generate independent components (ICs). The ICs include important information contained in the original observations. The ICs then serve as the input vectors for the SVM model to identify the time-series data pattern. Extensive simulation studies indicate that the proposed identifiers perform better than using raw data as inputs. © 2014, Chinese Society for Quality. All rights reserved.
引用
收藏
页码:413 / 426
页数:13
相关论文
共 18 条
[1]  
Al-Assaf Y., Recognition of control chart patterns using multi-resolution wavelets analysis and neural network, Computers & Industrial Engineering, 47, 1, pp. 17-29, (2004)
[2]  
Burges C.J.C., A tutorial on support vector machines for pattern recognition, Data Mining and Knowledge Discovery, 2, 2, pp. 121-167, (1998)
[3]  
Chang C.C., Lin C.J., LIBSVM 3.11: A library for support vector machines, ACM Transactions on Intelligent Systems and Technology, 27, 2, pp. 1-27, (2010)
[4]  
Cheng C.S., Group Technology and Expert Systems Concepts Applied to Statistical Process Control in Small-Batch Manufacturing, (1989)
[5]  
Cheng C.S., Hubele N.F., A pattern recognition algorithm for an x-bar control chart, IIE Transactions, 28, 3, pp. 215-224, (1996)
[6]  
Cheng H.P., Cheng C.S., Denoising and feature extraction for control chart pattern recognition in autocorrelated processes, International Journal of Signal and Imaging Systems Engineering, 1, 2, pp. 115-126, (2008)
[7]  
Das P., Banerjee I., An hybrid detection system of control chart patterns using cascaded SVM and neural network-based detector, Neural Computing and Applications, 20, 2, pp. 287-296, (2010)
[8]  
Guh R.S., Tannock J.D.T., Recognition of control chart concurrent patterns using a neural network approach, International Journal of Production Research, 37, 8, pp. 1743-1765, (1999)
[9]  
Hassan A., Baksh M.S.N., Shaharoun A.M., Jamaluddin H., Improved SPC chart pattern recognition using statistical features, International Journal of Production Research, 41, 7, pp. 1587-1603, (2003)
[10]  
Hsu C.W., Lin C.J., A comparison of methods for multiclass support vector machines, IEEE Transactions on Neural Networks, 13, 2, pp. 415-425, (2002)