A one-dimensional phase-shift technique based on dual-frequency crossed fringe for phase measuring deflectometry

被引：0

作者：

Liu, Yuankun ^{[1
]}

Olesch, Evelyn ^{[2
]}

Yang, Zheng ^{[2
]}

Häusler, Gerd ^{[2
]}

Su, Xianyu ^{[1
]}

机构：

[1] Opto-Electronic Department, Sichuan University, Chengdu, 610065, Sichuan

[2] Institute of Optics, Information and Photonics, University of Erlangen-Nuremberg, Erlangen

来源：

Zhongguo Jiguang/Chinese Journal of Lasers | 2015年 / 42卷 / 03期

关键词：

Crossed fringe; Measurement; Phase measuring deflectometry; Phase-shift; Structured illumination; Three-dimensional imaging;

D O I：

10.3788/CJL201542.0308005

中图分类号：

学科分类号：

摘要：

Phase measuring deflectometry (PMD) needs the two components of the local surface gradient via a sequence of two orthogonal sinusoidal fringe patterns that have to be displayed and captured separately. A novel phase-shift technique by using the cross fringe pattern is introduced, in which a one-dimensional N-phase shift allows for the acquisition of the two orthogonal phases, with only N exposures instead of 2N exposures. Therefore, it makes PMD possible be implemented by a one-dimensional translation of the fringe pattern, instead of the common two-dimensional translation, which will be quite useful for certain applications. ©, 2015, Science Press. All right reserved.

引用

页数：6

共 17 条

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