Quality-Guided Mask Cut Method for Phase Unwrapping

被引：0
|
作者：
Dong, Minghao [1 ]
Ma, Jun [1 ]
Xu, Cuieng [1 ]
Ling, Jing [1 ]
机构：
[1] Guilin University of Electronic Technology, School of Electronic Engineering and Automation, Guilin, China
来源：
Proceedings of SPIE - The International Society for Optical Engineering | 2023年 / 12585卷
关键词：
Engineering Village;
D O I：
125850W
中图分类号：
学科分类号：
摘要：
Cutting algorithm - Fringe projection profilometry - High quality - Mask cut - Phase retrieval - Phase unwrapping methods - Phase-unwrapping - Quality value - Quality-guide - Seed point
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