Improvement of in-plane spatial resolution in terahertz wave cross-section imaging

被引：0

作者：

Fukuchi, Tetsuo ^{[1
]}

Fuse, Norikazu ^{[1
]}

Mizuno, Maya ^{[2
]}

Fukunaga, Kaori ^{[2
]}

机构：

[1] Central Research Institute of Electric Power Industry, 2-6-1, Nagasaka, Yokosuka, Kanagawa

[2] National Institute of Information and Communications Technology, 4-2-1, Nukui-Kitamachi, Koganei, Tokyo

来源：

IEEJ Transactions on Electronics, Information and Systems | 2014年 / 134卷 / 08期

关键词：

Cross-sectional imaging; Frequency filtering; Spatial resolution; Terahertz wave; Unsharp mask processing;

D O I：

10.1541/ieejeiss.134.1039

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Improvement of the in-plane spatial resolution in cross-sectional imaging using terahertz waves was investigated. The effects of frequency filtering, which limits the frequency range of the terahertz waves, and unsharp mask processing, based on a two-dimensional convolution of the imaging result and a mask consisting of a linear combination of the original image and a Laplacian filter, were evaluated. The filtering methods were successful in improving the spatial resolution up to the sampling limit of 0.4 mm. The combination of frequency filtering and unsharp mask processing was found to be effective for improving the contrast in addition to the spatial resolution. Frequency filtering, unsharp mask processing, and their combination were applied to terahertz wave cross-sectional imaging of an IC card. © 2014 The Institute of Electrical Engineers of Japan.

引用

页码：1039 / 1048

页数：9

共 17 条

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