Survey on Redundancy Based-Fault tolerance methods for Processors and Hardware accelerators - Trends in Quantum Computing, Heterogeneous Systems and Reliability

被引:2
|
作者
Venkatesha, Shashikiran [1 ]
Parthasarathi, Ranjani [2 ]
机构
[1] Dayananda Sagar Univ, Dept Comp Sci & Engn, Kanakapura Rd, Bangalore, Karnataka, India
[2] Anna Univ, Dept Informat Sci & Technol, Coll Engn Guindy, Chennai, Tamil Nadu, India
关键词
Fault tolerance; reliability; redundancy; multi-core; faults; transient faults; permanent faults; ERROR-CORRECTION; CACHE; PERFORMANCE; PROTECTION; CODES;
D O I
10.1145/3663672
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Rapid progress in CMOS technology since the late 1990s has increased the vulnerability of processors toward faults. Subsequently, the focus of computer architects has shifted toward designing fault-tolerance methods for processor architectures. Concurrently, chip designers have encountered high-order challenges for designing fault-tolerant processor architectures. For processor cores, redundancy-based fault-tolerance methods for fault detection at the core, micro-architectural, thread, and software levels are discussed. Similar applicable redundancy-based fault-tolerance methods for cache memory and hardware accelerators are also presented in the article. Recent trends in fault-tolerant quantum computing and quantum error correction are also discussed. The classification of state-of-the-art techniques presented will help researchers organize their work on established lines.
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页数:76
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