Wide-angle antireflection effect of subwavelength structures for solar cells

被引：0

作者：

Sai, Hitoshi ^{[1
,3
]}

Fujii, Homare ^{[1
]}

Arafune, Koji ^{[1
]}

Ohshita, Yoshio ^{[1
]}

Kanamori, Yoshiaki ^{[2
]}

Yugami, Hiroo ^{[2
]}

Yamaguchi, Masafumi ^{[1
]}

机构：

[1] Toyota Technological Institute, 2-12-1 Hisakata, Tempaku, Nagoya 468-8511, Japan

[2] Graduate School of Engineering, Tohoku University, 6-6-01 Aoba, Aramaki, Aoba, Sendai 980-8579, Japan

[3] National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-7568, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2007年 / 46卷 / 6 A期

关键词：

The angle-dependent reflectivity of several surface structures was analyzed and evaluated with the viewpoint of solar cell applications. Numerical analysis showed that a Si subwavelength structure (SWS) maintains a lower reflectivity at large incident angles than conventional light-trapping techniques such as a random pyramid texture; and that it can contribute to increasing the output power of solar cells under oblique irradiation. This wide-angle antireflection effect was demonstrated by fabricating test crystalline Si cells with several surface structures including a SWS and measuring their angle-dependent short-circuit current densities. ©2007 The Japan Society of Applied Physics;

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学科分类号：

摘要：

Journal article (JA)

引用

页码：3333 / 3336

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