Two improved runs rules for the Shewhart X̄ control chart

被引：35

作者：

Khoo, Michael B.C. ^{[1
]}

Ariffin, Khotrun Nada Bt. ^{[1
]}

机构：

[1] School of Mathematical Sciences, Universiti Sains Malaysia, 11800 Minden, Penang

来源：

Quality Engineering | 2006年 / 18卷 / 02期

关键词：

Average run length (ARL); Lower control limit; Runs rules; Shewhart X̄ control chart; Upper control limit;

D O I：

10.1080/08982110600567517

中图分类号：

学科分类号：

摘要：

Runs rules are incorporated into the Shewhart X̄ control chart to increase its sensitivity in detecting small process shifts so that assignable causes can be detected more quickly. In this article, two improved runs rules are suggested. Average run length values for these new improved rules are computed and compared with that of the existing ones. The comparison shows that the new improved rules are superior in performance for large process average shifts, while maintaining the same sensitivity in the detection of small shifts. Copyright © Taylor & Francis Group, LLC.

引用

页码：173 / 178

页数：5

共 5 条

[1]

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[2]

Hurwitz A.M., Mathur M., A very simple set of process control rules, Quality Engineering, 5, pp. 21-29, (1992)

[3]

Klein M., Two alternatives to the Shewhart X̄ control chart, Journal of Quality Technology, 32, pp. 427-431, (2000)

[4]

Montgomery D.C., Introduction to Statistical Quality Control, (2001)

[5]

Nelson L.S., The Shewhart control chart - Tests for special causes, Journal of Quality Technology, 16, pp. 237-239, (1984)

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