Origin of the vanishing critical thickness for ferroelectricity in free-standing PbTiO3 ultrathin films from first principles

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[1] Yin, Binglun

[2] Qu, Shaoxing

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| 1600年 / American Institute of Physics Inc.卷 / 114期

关键词：

Ultrathin films;

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Journal article (JA)

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[1] Origin of the vanishing critical thickness for ferroelectricity in free-standing PbTiO3 ultrathin films from first principles
Yin, Binglun
Qu, Shaoxing
JOURNAL OF APPLIED PHYSICS, 2013, 114 (06)
[2] Ab initio study of the critical thickness for ferroelectricity in ultrathin Pt/PbTiO3/Pt films
Umeno, Yoshitaka
Meyer, Bernd
Elsaesser, Christian
Gumbsch, Peter
PHYSICAL REVIEW B, 2006, 74 (06)
[3] Ferroelectricity in PbTiO3 thin films: a first principles approach
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[4] Ferroelectricity in PbTiO3 thin films:: A first principles approach
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[5] Investigation of ferroelectricity in ultrathin PbTiO3 films
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[6] Ferroelectricity in PbTiO3 Thin Films: A First Principles Approach
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[9] Use of the solvent chemistry for the control of the critical thickness of PbTiO3 ultrathin films
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[10] Use of the solvent chemistry for the control of the critical thickness of PbTiO3 ultrathin films
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