Reliability analysis for accelerated life test based on Weibull distribution

被引：1

作者：

Li L. ^{[1
]}

Xu W. ^{[1
]}

机构：

[1] Dept. of Applied Mathematics, Northwestern Polytechnical Univ.

来源：

Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2010年 / 32卷 / 07期

关键词：

Accelerated life test; Confidence intervals; Likelihood estimates; Weibull distribution;

D O I：

10.3969/j.issn.1001-506X.2010.07.045

中图分类号：

学科分类号：

摘要：

In order to make inference about problems of accelerated life test plan under different experiments, a step-stress accelerated life test model of units based on Weibull lifetimes is given. For this model, the maximum likelihood estimates of the parameters in normal stress level are derived under Type-II censoring. The Newton-Raphson method is using to solve the likelihood equations, and a simplified estimator is presented, which is used as an initial estimate in the iterative process. Bootstrap confidence intervals for the parameters are provided. Some numerical results for solid tantalum electrolytic capacitor are discussed to illustrate validity of this model.

引用

页码：1544 / 1548

页数：4

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