共 50 条
- [22] Comment on `Electron microprobe quantification: A new model based on electrons rather than on mass' [J. Appl. Phys. 86, 2790 (1999)] 1600, American Inst of Physics, Woodbury, NY, USA (87):
- [27] Comment on `Analysis of high-resolution X-ray diffraction in semiconductor strained layers' [J. Appl. Phys. 86, 782 (1999)] 1600, American Inst of Physics, Woodbury, NY, USA (87):