Characterization on the structure and property of nanometer Ag/SiO2 antibacterial agent

被引：0
|
作者：
College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China [1 ]
不详 [2 ]
不详 [3 ]
机构：
来源：
Gongneng Cailiao | 2006年 / SUPPL.卷 / 694-696期
关键词：
4;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Structure transition, formation, and optical absorption property study of Ag/SiO2 nanofilm by sol-gel method
    Li, Yan
    Zhang, Bo-Ping
    Zhao, Cui-Hua
    Zhao, Jin-Xian
    JOURNAL OF MATERIALS RESEARCH, 2012, 27 (24) : 3141 - 3146
  • [42] Tunable optical properties of SiO2/Ag double-layer and SiO2/Ag/SiO2 triple-layer hybrid structures
    Xiao, Yang
    Zhang, Hong
    PHYSICA B-CONDENSED MATTER, 2021, 605
  • [43] Structure and property of SPEEK/SiO2 composite proton exchange membranes
    Zhang, Gao-Wen
    Zhou, Zhen-Tao
    Gaofenzi Cailiao Kexue Yu Gongcheng/Polymeric Materials Science and Engineering, 2007, 23 (02): : 124 - 127
  • [44] Structure transition, formation, and optical absorption property study of Ag/SiO2 nanofilm by sol-gel method
    Yan Li
    Bo-Ping Zhang
    Cui-Hua Zhao
    Jin-Xian Zhao
    Journal of Materials Research, 2012, 27 : 3141 - 3146
  • [45] Characterization of Berreman modes in metal/dielectric Ag/SiO2 and Ag/MgF2 multilayers
    Bichri, A
    Lafait, J
    Welsch, H
    AbdLefdil, M
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1997, 9 (31) : 6523 - 6532
  • [46] Nanometer SiO2 Antireflection Coating for Solar Modules
    Wei, Wei
    Zhu, Xiaoning
    Zhao, Yan
    Wu, Qiang
    PROCEEDINGS OF THE 2015 INTERNATIONAL CONFERENCE ON MATERIALS CHEMISTRY AND ENVIRONMENTAL PROTECTION (MEEP-15), 2016, 4
  • [47] Preparation of Ge/SiO2 nanometer-crystal doped glass and study of its photoluminescence property
    Gu, XT
    Feng, YY
    Jin, TS
    Yu, ZQ
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2004, 24 (10) : 1161 - 1163
  • [48] Electroforming of Si/SiO2/W Structures with an Exposed Nanometer-Thick SiO2 Layer
    Mordvintsev V.M.
    Kudryavtsev S.E.
    Russian Microelectronics, 2001, 30 (5) : 303 - 311
  • [49] Electroforming of Si/SiO2/W structures with an exposed nanometer-thick SiO2 layer
    Mordvintsev, V.M.
    Kudryavtsev, S.E.
    2001, Nauka Moscow (30):
  • [50] Nucleation Phenomenon in Silica Xerogels and Pd/SiO2, Ag/SiO2, Cu/SiO2 Cogelled Catalysts
    Christelle Alié
    Stéphanie Lambert
    Benoît Heinrichs
    Jean-Paul Pirard
    Journal of Sol-Gel Science and Technology, 2003, 26 : 827 - 830
12345