X-ray diffraction study of nanocrystalline tungsten nitride and tungsten to 31 GPa

被引：0
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作者：
Ma, Yanzhang [1 ]
Cui, Qiliang [2 ]
Shen, Longhai [2 ]
He, Zhaoming [1 ]
机构：
[1] Department of Mechanical Engineering, Texas Tech University, Lubbock, TX 79409, United States
[2] National Laboratory of Superhard Materials, Jilin University, Changchun 130012, China
来源：
Journal of Applied Physics | 2007年 / 102卷 / 01期
关键词：
X-ray diffraction measurement determined that a newly synthesized nanocrystalline tungsten nitride (W2 N) has a substantially larger cell parameter than its bulk material. Yet the lattice of a metal nanocrystalline tungsten (W) remained unchanged. High-pressure diffraction study to 31 GPa resolved a much lower bulk modulus of 240 GPa for nanocrystalline W2 N and a relatively unchanged bulk modulus of 307 GPa for nanocrystalline W compared to its bulk material. We found that the metallic bonding of a metal is not affected by reduction of the grain size. The enlarged cell parameter and the relatively low bulk modulus of W2 N reflect the size effect of nanocrystalline W2 N. © 2007 American Institute of Physics;
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