Fault diagnosis based on Dempster evidential clustering algorithm

被引：0
|
作者：
Hong, Bei [1 ]
Hu, Changhua [1 ]
Jiang, Xuepeng [2 ]
机构：
[1] Unit 302, Xi'an Institute of Hi.-Tech., Xi'an 710025, China
[2] Department of Strategic Missile Engineering, Naval Aeronautical and Astronautical University, Yantai 264001, China
来源：
Nanjing Hangkong Hangtian Daxue Xuebao/Journal of Nanjing University of Aeronautics and Astronautics | 2011年 / 43卷 / SUPPL.1期
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页码：134 / 137
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