Mechanical overview of the International X-ray Observatory

被引：0

作者：

NASA Goddard Space Flight Center, Greenbelt, MD 20771, United States ^{[1
]}

机构：

来源：

IEEE Aerosp. Conf. Proc. | 2009年

关键词：

Compendex;

D O I：

4839581

中图分类号：

学科分类号：

摘要：

Observatories

引用

共 50 条

[31] ANISOTROPY OF X-RAY CRITICAL SCATTERING IN EEBAC
RAJEWSKA, A
PURA, B
PRZEDMOJSKI, J
JOURNAL DE PHYSIQUE, 1982, 43 (11): : 1669 - 1672
[32] ADVANCED X-RAY ASTROPHYSICS FACILITY (AXAF)
ZOMBECK, MV
OPTICAL ENGINEERING, 1981, 20 (02) : 297 - 309
[33] ON THE CHARACTERIZATION OF HETEROSTRUCTURES BY X-RAY DIFFRACTION.
Varga, L.
Nagy, A.T.
Gorog, T.
Lendvay, E.
Acta Technica (Budapest), 1975, 80 (1-2): : 293 - 301
[34] Theory of the X-Ray Integral Method.
Lode, Waldemar
Peiter, Arnold
Haerterei-Technische Mitteilungen, 1980, 35 (03): : 148 - 155
[35] Toward nanoscopic cellular imaging by X-ray
Gao, Jie
Gu, Zhen
NATIONAL SCIENCE REVIEW, 2021, 8 (03)
[36] VACUUM WAVEGUIDE FOR THE X-RAY REGION.
Anderson, J.P.
IBM Technical Disclosure Bulletin, 1974, 17 (03): : 759 - 760
[37] Measurement of X-ray quantum linear polarization
Almaliev A.N.
Kopytin I.V.
Lisovoi S.A.
Churakova T.A.
Bulletin of the Russian Academy of Sciences: Physics, 2009, 73 (11) : 1488 - 1490
[38] ANALYTICAL APPROXIMATIONS FOR X-RAY ATTENUATION COEFFICIENTS
GERWARD, L
NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3): : 11 - 14
[39] X-RAY SPECTROMETER SPECTROGRAPH TELESCOPE SYSTEM
BRUNER, EC
ACTON, LW
BROWN, WA
SALAT, SW
FRANKS, A
SCHMIDTKE, G
SCHWEIZER, W
SPEER, RJ
OPTICAL ENGINEERING, 1980, 19 (03) : 433 - 437
[40] INCREASING THE SENSITIVITY OF X-RAY PHOTOMATERIALS.
Ulanov, V.M.
Soviet physics. Technical physics, 1980, 25 (05): : 628 - 630