Thermodynamic analysis of stress effect on Bi4Ti 3O12 films

被引：0

作者：

Li, Li-Ben ^{[1
]}

Lu, Xia-Mei ^{[2
]}

Chen, Qing-Dong ^{[1
]}

Wu, Xiu-Mei ^{[2
]}

Zhu, Jin-Song ^{[2
]}

机构：

[1] School of Science, Henan University of Science and Technology, Luoyang 471003, China

[2] National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing 210093, China

来源：

Journal of Applied Physics | 2008年 / 103卷 / 03期

关键词：

Thermodynamic theory is applied to study the effect of stress on the polarization of Bi4 Ti3 O12 films with a two-dimensional model. The spontaneous polarizations and free energies are calculated for three possible kinds of orientations of the Bi4 Ti3 O12 cell and nine ferroelectric phases in the Bi4 Ti3 O12 films. The stress effect on the spontaneous polarization caused by the lattice distortion is small and can be neglected for all the stable ferroelectric phases; whereas the domain reorientation induced by the competition between the external stress and a gradient intrinsic stress leads to a significant change of spontaneous polarization in Bi4 Ti3 O12 films. The calculation result agrees well with the experimental result on Nd-doped Bi4 Ti3 O12 films. © 2008 American Institute of Physics;

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摘要：

Journal article (JA)

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