Imaging diffraction spectroscopy: A forward modeling approach to electron back - Scatter diffraction patterns

被引：0

作者：

机构：

[1] De Graef, Marc

来源：

De Graef, M. | 1600年 / SPIE卷 / 8657期

关键词：

Spectroscopy;

D O I：

10.1117/12.2021498

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