Effect of polarization direction on the electric field distribution at the near-field of a tip-on-aperture near-field scanning optical microscope probe

被引：0
|
作者：
Kim, Jin-Beom [1 ]
Na, Suck-Joo [1 ]
Chang, Won-Seok [2 ]
机构：
[1] Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea, Republic of
[2] Nano Machining Team, Korea Institute of Machinery and Materials, Daejeon 305-343, Korea, Republic of
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2007年 / 46卷 / 8 B期
关键词：
A tip-on-aperture (TOA) probe is a novel near-field scanning optical microscope (NSOM) probe; which combines the features of aperture and apertureless probes. It has a small metallic tip at the end of an aperture NSOM's probe. The tip is illuminated through an aperture at the near field of the probe and electromagnetic interaction between the structured sharp tip at the end of the probe and the surface is used for measurements and materials processing. In this study; the electric field distributions at the near-field of a TOA probe were calculated numerically to analyze the effects of polarization direction on the characteristics of measurement and processing. A TOA probe is asymmetric for the axis; since it has a probe at metal coated layer on the aperture. The geometrical relationship between this asymmetric shape and polarization direction is the reason for the change of the electromagnetic energy distributions. Numerical analysis shows that a TOA probe can make the best use of the tip for high resolutions when the tip is located on the parallel axis with the polarization direction. © 2007 The Japan Society of Applied Physics;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
页码：5577 / 5581
相关论文
共 50 条
  • [21] A scanning near-field optical microscope
    Saratovskij Gosudarstvennyj, Technicheskij Univ, Saratov, Russia
    Prib Tekh Eksp, 2 (140-143):
  • [22] Scanning tip microwave near-field microscope
    Appl Phys Lett, 24 (3506):
  • [23] Scanning tip microwave near-field microscope
    Wei, T
    Xiang, XD
    WallaceFreedman, WG
    Schultz, PG
    APPLIED PHYSICS LETTERS, 1996, 68 (24) : 3506 - 3508
  • [24] ON THE HEATING OF THE FIBER TIP IN A NEAR-FIELD SCANNING OPTICAL MICROSCOPE
    KAVALDJIEV, DI
    TOLEDOCROW, R
    VAEZIRAVANI, M
    APPLIED PHYSICS LETTERS, 1995, 67 (19) : 2771 - 2773
  • [25] A simple model of the scanning near-field optical microscopy probe tip for electric field enhancement
    Wang, Yingjie
    Cai, Wei
    Yang, Mu
    Liu, Zhengliang
    Shang, Guangyi
    OPTICA APPLICATA, 2017, 47 (01) : 119 - 130
  • [26] Simulation of near-field optical manipulator using the combination of a near-field scanning optical microscope probe and an atomic force microscope metallic probe
    Liu, Binghui
    Yang, Lijun
    Wang, Yang
    JOURNAL OF APPLIED PHYSICS, 2011, 109 (10)
  • [27] NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A LASER TRAPPED PROBE
    KAWATA, S
    INOUYE, Y
    SUGIURA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (12A): : L1725 - L1727
  • [28] Laser acts as near-field scanning optical microscope probe
    Burgess, DS
    PHOTONICS SPECTRA, 2006, 40 (06) : 129 - 130
  • [29] Laser acts as near-field scanning optical microscope probe
    Photonics Spectra, 2006, 6 (129-130)
  • [30] Sensitivity analysis of scanning near-field optical microscope probe
    Fang, TH
    Chang, WJ
    OPTICS AND LASER TECHNOLOGY, 2003, 35 (04): : 267 - 271
12345