Electronic properties and dopant pairing behavior of manganese in boron-doped silicon

被引:0
|
作者
Roth, T. [1 ]
Rosenits, P. [1 ]
Diez, S. [1 ,4 ]
Glunz, S.W. [1 ]
MacDonald, D. [2 ]
Beljakowa, S. [3 ]
Pensl, G. [3 ]
机构
[1] Fraunhofer Institute for Solar Energy Systems (ISE), Heidenhofstrasse 2, 79110 Freiburg, Germany
[2] Department of Engineering, College of Engineering and Computer Science, Australian National University, Canberra, ACT 0200, Australia
[3] Lehrstuhl für Angewandte Physik (LAP), University of Erlangen Nürnberg, 91058 Erlangen, Germany
[4] Q-Cells AG, Thalheim, Germany
来源
Journal of Applied Physics | 2007年 / 102卷 / 10期
关键词
Silicon wafers;
D O I
暂无
中图分类号
学科分类号
摘要
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [1] Electronic properties and dopant pairing behavior of manganese in boron-doped silicon
    Roth, T.
    Rosenits, P.
    Diez, S.
    Glunz, S. W.
    JOURNAL OF APPLIED PHYSICS, 2007, 102 (10)
  • [2] Correlating dopant distributions and electrical properties of boron-doped silicon nanowires
    Schlitz, Ruth A.
    Perea, Daniel E.
    Lensch-Falk, Jessica L.
    Hemesath, Eric R.
    Lauhon, Lincoln J.
    APPLIED PHYSICS LETTERS, 2009, 95 (16)
  • [3] RESISTIVITY-DOPANT DENSITY RELATIONSHIP FOR BORON-DOPED SILICON
    THURBER, WR
    MATTIS, RL
    LIU, YM
    FILLIBEN, JJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (10) : 2291 - 2294
  • [4] Evolution of structural and electronic properties in boron-doped nanocrystalline silicon thin films
    Lee, Hyun Jung
    Sazonov, Andrei
    Nathan, Arokia
    AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY 2007, 2007, 989 : 503 - +
  • [5] PHOTOELECTROCHEMICAL PROPERTIES OF BORON-DOPED SILICON ELECTRODE
    GORODYSKY, AV
    KOLBASOV, GY
    TARANENKO, NI
    LIPYAVKA, VG
    DOPOVIDI AKADEMII NAUK UKRAINSKOI RSR SERIYA B-GEOLOGICHNI KHIMICHNI TA BIOLOGICHNI NAUKI, 1987, (04): : 44 - 47
  • [6] MAGNETIC-PROPERTIES OF BORON-DOPED SILICON
    SARACHIK, MP
    HE, DR
    LI, W
    LEVY, M
    BROOKS, JS
    PHYSICAL REVIEW B, 1985, 31 (03): : 1469 - 1477
  • [7] DOPANT DENSITY AND TEMPERATURE-DEPENDENCE OF HOLE MOBILITY IN BORON-DOPED SILICON
    LI, SS
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (10): : 1242 - 1242
  • [8] Electronic properties of light-induced recombination centers in boron-doped Czochralski silicon
    Schmidt, J
    Cuevas, A
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (06) : 3175 - 3180
  • [9] Structural and electronic properties of boron-doped double-walled silicon carbide nanotubes
    Behzad, Somayeh
    Moradian, Rostam
    Chegel, Raad
    PHYSICS LETTERS A, 2010, 375 (02) : 174 - 179
  • [10] Properties of Boron-Doped Thin Films of Polycrystalline Silicon
    Merabet, Souad
    3RD INTERNATIONAL ADVANCES IN APPLIED PHYSICS AND MATERIALS SCIENCE CONGRESS, 2013, 1569 : 314 - 318