共 22 条
- [1] Mead C., Neuromorphic electronic systems, Proceedings of the IEEE, 78, 10, pp. 1629-1636, (1990)
- [2] Xia L X, Tang T Q, Huangfu W Q, Et al., Switched by input: power efficient structure for RRAM-based convolutional neural network, Proceedings of the 53rd Annual Design Automation Conference, pp. 1-6, (2016)
- [3] Chi P, Li S C, Xu C, Et al., PRIME: a novel processing-in-memory architecture for neural network computation in ReRAM-based main memory, Proceedings of the 43rd ACM/IEEE Annual International Symposium on Computer Architecture, pp. 27-39, (2016)
- [4] Xia L X, Ling M Y, Ning X F, Et al., Fault-tolerant training enabled by on-line fault detection for RRAM-based neural computing systems, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 38, 9, pp. 1611-1624, (2019)
- [5] Liang J L, Wong H S P., Cross-point memory array without cell selectors—device characteristics and data storage pattern dependencies, IEEE Transactions on Electron Devices, 57, 10, pp. 2531-2538, (2010)
- [6] Yu S M, Chen P Y, Cao Y, Et al., Scaling-up resistive synaptic arrays for neuro-inspired architecture: challenges and prospect, Proceedings of IEEE International Electron Devices Meeting, pp. 451-454, (2015)
- [7] Zhu Y J, Zhao X, Qiu K N, Et al., Insights and optimizations on IR-drop induced sneak-path for RRAM crossbar-based convolutions, Proceedings of the 25th Asia and South Pacific Design Automation Conference, pp. 506-511, (2020)
- [8] Liao Y, Gao B, Yao P, Et al., Diagonal matrix regression layer: training neural networks on resistive crossbars with interconnect resistance effect, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 40, 8, pp. 1662-1671, (2021)
- [9] Liu B Y, Li H, Chen Y R, Et al., Reduction and IR-drop compensations techniques for reliable neuromorphic computing systems, Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, pp. 63-70, (2014)
- [10] Brambilla A, Premoli A, Storti-Gajani G., Recasting modified nodal analysis to improve reliability in numerical circuit Simulation, IEEE Transactions on Circuits and Systems I: Regular Papers, 52, 3, pp. 522-534, (2005)