Trends of optical inspection for PWBA

被引：0
|
作者：
机构：
[1] Engineerring and Development Department, Nagoya Electric Works Co., Ltd., Shinoda, Ama-shi, Aichi 490-1294
来源：
Toyoshima, Y. | 1600年 / Japan Institute of Electronics Packaging卷 / 16期
关键词：
D O I：
10.5104/jiep.16.504
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：504 / 507
页数：3
相关论文
共 50 条
  • [41] Criteria for optical sheet inspection
    Krampe, R
    KUNSTSTOFFE-PLAST EUROPE, 2003, 93 (05): : 57 - +
  • [42] Optical preprocessing as inspection tool?
    Hild, R.
    Nitzsche, G.
    Altenburger, U.
    Optik (Jena), 1995, 99 (03): : 123 - 133
  • [43] OPTICAL PREPROCESSING AS INSPECTION TOOL
    HILD, R
    NITZSCHE, G
    ALTENBURGER, U
    OPTIK, 1995, 99 (03): : 123 - 133
  • [44] Optical methods for food inspection
    Chao, Kevin
    Kim, Moon S.
    Lawrence, Kurt C.
    Sensing and Instrumentation for Food Quality and Safety, 2008, 2 (02): : 73 - 74
  • [45] OPTICAL METHODS FOR SURFACE INSPECTION
    AHLERS, RJ
    WERKSTATTSTECHNIK ZEITSCHRIFT FUR INDUSTRIELLE FERTIGUNG, 1984, 74 (08): : 465 - 468
  • [46] OPTICAL TECHNOLOGIES FOR TSV INSPECTION
    Aiyer, Arun A.
    Maltsev, Nikolai
    Ryu, Jae
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXVIII, 2014, 9050
  • [47] SOME TRENDS IN DEVELOPMENT OF AUTOMATIC INSPECTION AND TESTING
    CARLISLE, SS
    BUGDEN, AR
    MESURES REGULATION AUTOMATISME, 1971, 36 (04): : 106 - &
  • [48] A methodology for an integrated (electrical/mechanical) design of PWBA
    Novotny, S
    Ahn, W
    Agonafer, D
    ELECTRONIC AND PHOTONIC PACKAGING, ELECTRICAL SYSTEMS AND PHOTONIC DESIGN AND NANOTECHNOLOGY - 2003, 2003, : 721 - 727
  • [49] METROLOGY AND INSPECTION - SOME PRESENT AND FUTURE TRENDS
    ASTROP, AW
    MACHINERY AND PRODUCTION ENGINEERING, 1973, 122 (3143): : 214 - 220
  • [50] Methodology for an integrated (electrical/mechanicail) design of PWBA
    Ahn, W
    Agonafer, D
    Novotny, S
    JOURNAL OF ELECTRONIC PACKAGING, 2004, 126 (04) : 524 - 527
12345