Spectral surface plasmon resonance sensor insensitive to the thickness of metal films

被引：0

作者：

Liu L. ^{[1
]}

Liu Z. ^{[2
]}

Chen X. ^{[2
]}

Ma S. ^{[2
]}

Du C. ^{[2
]}

He Y. ^{[2
]}

Guo J. ^{[2
]}

机构：

[1] Laboratory of Advanced Power Source, Graduate School at Shenzhen, Tsinghua University, Shenzhen

[2] Laboratory of Optical Imaging and Sensing, Graduate School at Shenzhen, Tsinghua University, Shenzhen

来源：

Zhongguo Jiguang/Chinese Journal of Lasers | 2011年 / 38卷 / SUPPL. 1期

关键词：

Film thickness; Polarization interferometry; Spectral; Spectrosopy; Surface plasmon resonance;

D O I：

10.3788/CJL201138.s114004

中图分类号：

学科分类号：

摘要：

Surface plasmon resonance (SPR) sensing technique has a very high refractive-index (RI) resolution. However, this RI resolution is very sensitive to the thickness of metal films, deteriorating the adaptability of SPR sensors. The sensitivity of RI resolution of a spectral SPR sensor to the thickness of metal films is reduced by a technique called "polarization interferometry (PI)". That the PI technique could reduce the minimum of the SPR spectrum is experimentally demonstrated, and the RI resolution of the sensors with non-optimal metal films is improved. RI resolution ranging from 3.9×10 -7 to 8.1×10 -7 refractive index unit (RIU) is achieved with the thickness of the Au film ranging from 28.16 to 54.38 nm.

引用

页码：s114004 / 1

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