Insulator surface charge measurement using an improved capacitive probe

被引：6
|
作者：
State Key Lab. for Electrical Insulation and Apparatus, Xi'an Jiaotong University, Xi'an 710049, China [1 ]
不详 [2 ]
不详 [3 ]
不详 [4 ]
机构：
来源：
Plasma Sci. Technol. | 2006年 / 5卷 / 565-568期
关键词：
Capacitance - Error analysis - Leakage currents - Measurement theory - Probes - Surface phenomena;
D O I：
10.1088/1009-0630/8/5/15
中图分类号：
学科分类号：
摘要：
A surface charge measuring system using the capacitive probe method is analysed. The present study shows that the measuring system cannot have a steady-state output and that the error resulting from the finite leakage resistance of the measuring system will be accumulated during the measuring process. Based on the theoretical analysis a new type probe with a low charge leakage and high resolution is designed. The surface charge accumulated on the Teflon insulator under a DC voltage is measured using this new probe and some phenomena of the surface charging are reported.
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