Hierarchical Neural Networks Method for Fault Diagnosis of Large-Scale Analog Circuits

被引:0
|
作者
College of Electric and Information Engineering, Hunan University, Changsha, 410082, China [1 ]
机构
来源
Tsinghua Science and Technology | 2007年 / 12卷 / SUPPL. 1期
基金
中国国家自然科学基金;
关键词
Analog circuits - Circuit simulation - Failure analysis - Fault tolerance - LSI circuits - Neural networks;
D O I
10.1016/S1007-0214(07)70121-9
中图分类号
学科分类号
摘要
A novel hierarchical neural networks (HNNs) method for fault diagnosis of large-scale circuits is proposed. The presented techniques using neural networks(NNs) approaches require a large amount of computation for simulating various faulty component possibilities. For large scale circuits, the number of possible faults, and hence the simulations, grow rapidly and become tedious and sometimes even impractical. Some NNs are distributed to the torn sub-blocks according to the proposed torn principles of large scale circuits. And the NNs are trained in batches by different patterns in the light of the presented rules of various patterns when the DC, AC and transient responses of the circuit are available. The method is characterized by decreasing the over-lapped feasible domains of responses of circuits with tolerance and leads to better performance and higher correct classification. The methodology is illustrated by means of diagnosis examples. © 2007 Tsinghua University Press.
引用
收藏
页码:260 / 265
相关论文
共 50 条
  • [1] Neural network method of fault diagnosis for large-scale analogue circuits
    Tan, YH
    He, YG
    Wu, J
    CHINESE JOURNAL OF ELECTRONICS, 2003, 12 (01): : 57 - 60
  • [2] Robust fault diagnosis for large-scale analog circuits with measurement noises
    Sheu, HT
    Chang, YH
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS, 1997, 44 (03): : 198 - 209
  • [3] A neural network approach for fault diagnosis of large-scale analogue circuits
    He, YG
    Tan, YH
    Sun, YC
    2002 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, PROCEEDINGS, 2002, : 153 - 156
  • [4] Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits
    M. A. El-Gamal
    M. D. A. Mohamed
    Journal of Electronic Testing, 2007, 23 : 323 - 339
  • [5] Ensembles of neural networks for fault diagnosis in analog circuits
    El-Gamal, M. A.
    Mohamed, M. D. A.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2007, 23 (04): : 323 - 339
  • [6] EXPERIMENT ON FAULT LOCATION IN LARGE-SCALE ANALOG CIRCUITS
    CHEN, YQ
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1993, 42 (01) : 30 - 34
  • [7] Large-scale analogue circuits fault diagnosis based on body method
    Tan, YH
    He, YG
    Kang, ZW
    6TH WORLD MULTICONFERENCE ON SYSTEMICS, CYBERNETICS AND INFORMATICS, VOL XVII, PROCEEDINGS: INDUSTRIAL SYSTEMS AND ENGINEERING III, 2002, : 300 - 303
  • [8] Study on fault location in large-scale analog tolerance circuits
    Chen, SJ
    Wang, YF
    Zhang, WX
    ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS, 2001, : 536 - 539
  • [9] Analog fault diagnosis of actual circuits using neural networks
    Aminian, F
    Aminian, M
    Collins, HW
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2002, 51 (03) : 544 - 550
  • [10] A Novel Fault Diagnosis Method for Analog Circuits Based on Conditional Variational Neural Networks
    Gao, Tianyu
    Yang, Jingli
    Jiang, Shouda
    Yan, Ge
    CIRCUITS SYSTEMS AND SIGNAL PROCESSING, 2021, 40 (06) : 2609 - 2633