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Lai Y.-C., Huang S.-Y., X-Calibration: A Technique for Combating Excessive Bitline Leakage Current in Nanometer SRAM Designs, IEEE Journal of Solid-State Circuits, 43, 9, pp. 1964-1971, (2008)
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Shigang H., Xiaofeng W., Xi Z., Research on the gate leakage current of PMOSFET with ultra-thin gate oxide, Journal of Convergence Information Technology, 7, 11, pp. 44-51, (2012)
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Hu S.-G., Wu X.-F., Xi Z.-F., Impact of direct tunneling current on CMOS logic circuit, International Journal of Digital Content Technology and Its Applications, 6, 8, pp. 231-238, (2012)
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Agawa K., Hara H., Takayanagi T., Kuroda T., A bitline leakage compensation scheme for low-voltage SRAMs, IEEE Journal of Solid-State Circuits, 36, 5, pp. 726-734, (2001)
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Wicht B., Paul S., Doris S.-L., Analysis and compensation of the bitline multiplexer in SRAM current sense amplifiers, IEEE Journal of Solid-State Circuits, 36, 11, pp. 1745-1755, (2001)
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Sharifkhani M., Rahiminejad E., Jahinuzzaman S.M., Sachdev M., A Compact Hybrid Current/Voltage Sense Amplifier With Offset Cancellation for High-Speed SRAMs, IEEE Transactions On Very Large Scale Integration (VLSI) Systems, 19, 5, pp. 883-894, (2011)
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Do A.-T., Kong Z.-H., Yeo K.-S., Low J.Y., Design and Sensitivity Analysis of a New Current-Mode Sense Amplifier for Low-Power SRAM, IEEE Transactions On Very Large Scale Integration (VLSI) Systems, 19, 2, pp. 196-204, (2011)
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